Browsing by Author Drévillon, B.

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Issue DateTitleAuthor(s)
1990In situ spectroellipsometric study of the nucleation and growth of amorphous siliconCanillas i Biosca, Adolf; Bertrán Serra, Enric; Andújar Bella, José Luis; Drévillon, B.
Aug-1993Phase-modulated ellipsometer using a Fourier transform infrared spectrometer for real time applicationsCanillas i Biosca, Adolf; Pascual Miralles, Esther; Drévillon, B.
1986Spectroscopic ellipsometry study of the In1-x Gax Asy P1-y / InP Heterojunctions grown by metalorganic chemical-vapor depositionDrévillon, B.; Bertrán Serra, Enric; Alnot, P.; Olivier, J.; Razeghi, M.