Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/10601
 Title: Fractional exclusion statistics and shot noise in ballistic conductors Author: Gomila Lluch, GabrielReggiani, L. (Lino), 1941- Keywords: Fluctuations (Physics)Soroll electrònicSemiconductorsFluctuacions (Física)Electronic noiseSemiconductors Issue Date: 2001 Publisher: The American Physical Society Abstract: We study the noise properties of ballistic conductors with carriers satisfying fractional exclusion statistics. To test directly the nature of exclusion statistics we found that systems under weakly degenerate conditions should be considered. Typical of these systems is that the chemical potential $\ensuremath{\mu}$ is in the thermal range $|\ensuremath{\mu}|l{3k}_{B}T.$ In these conditions the noise properties under current saturation are found to depend upon the statistical parameter g, displaying suppressed shot noise for $1/2l~gl~1,$ and enhanced shot noise for $0lgl1/2,$ according to the attractive or repulsive nature of the carrier exclusion statistics. Note: Reproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevB.63.165404 It is part of: Physical Review B, 2001, vol. 63, núm. 16, p. 165404-1-165404-6 Related resource: http://doi.org/10.1103/PhysRevB.63.165404 URI: http://hdl.handle.net/2445/10601 ISSN: 0163-1829 Appears in Collections: Articles publicats en revistes (Electrònica)

Files in This Item:
File Description SizeFormat