Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/10601
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dc.contributor.authorGomila Lluch, Gabrielcat
dc.contributor.authorReggiani, L. (Lino), 1941-cat
dc.date.accessioned2009-12-28T11:22:57Z-
dc.date.available2009-12-28T11:22:57Z-
dc.date.issued2001cat
dc.identifier.issn0163-1829cat
dc.identifier.urihttp://hdl.handle.net/2445/10601-
dc.description.abstractWe study the noise properties of ballistic conductors with carriers satisfying fractional exclusion statistics. To test directly the nature of exclusion statistics we found that systems under weakly degenerate conditions should be considered. Typical of these systems is that the chemical potential $\ensuremath{\mu}$ is in the thermal range $|\ensuremath{\mu}|l{3k}_{B}T.$ In these conditions the noise properties under current saturation are found to depend upon the statistical parameter g, displaying suppressed shot noise for $1/2l~gl~1,$ and enhanced shot noise for $0lgl1/2,$ according to the attractive or repulsive nature of the carrier exclusion statistics.-
dc.format.extent6 p.cat
dc.format.mimetypeapplication/pdfeng
dc.language.isoengeng
dc.publisherThe American Physical Societyeng
dc.relation.isformatofReproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevB.63.165404cat
dc.relation.ispartofPhysical Review B, 2001, vol. 63, núm. 16, p. 165404-1-165404-6eng
dc.relation.urihttp://doi.org/10.1103/PhysRevB.63.165404-
dc.rights(c) The American Physical Society, 2001eng
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)-
dc.subject.classificationFluctuations (Physics)cat
dc.subject.classificationSoroll electròniccat
dc.subject.classificationSemiconductorscat
dc.subject.classificationFluctuacions (Física)cat
dc.subject.otherElectronic noiseeng
dc.subject.otherSemiconductorseng
dc.titleFractional exclusion statistics and shot noise in ballistic conductorseng
dc.typeinfo:eu-repo/semantics/articleeng
dc.typeinfo:eu-repo/semantics/publishedVersion-
dc.identifier.idgrec526802cat
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess-
Appears in Collections:Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)

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