Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/10643
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dc.contributor.authorHerranz Casabona, Gervasicat
dc.contributor.authorMartínez Benjamin, Joan Josepcat
dc.contributor.authorFontcuberta i Griñó, Josepcat
dc.contributor.authorSánchez Barrera, Florenciocat
dc.contributor.authorFerrater Martorell, Cèsarcat
dc.contributor.authorGarcía-Cuenca Varona, María Victoriacat
dc.contributor.authorVarela Fernández, Manuel, 1956-cat
dc.date.accessioned2009-12-29T11:13:47Z-
dc.date.available2009-12-29T11:13:47Z-
dc.date.issued2003cat
dc.identifier.issn0163-1829cat
dc.identifier.urihttp://hdl.handle.net/2445/10643-
dc.description.abstractEpitaxial and fully strained SrRuO3 thin films have been grown on SrTiO3(100). At initial stages the growth mode is three-dimensional- (3D-)like, leading to a finger-shaped structure aligned with the substrate steps and that eventually evolves into a 2D step-flow growth. We study the impact that the defect structure associated with this unique growth mode transition has on the electronic properties of the films. Detailed analysis of the transport properties of nanometric films reveals that microstructural disorder promotes a shortening of the carrier mean free path. Remarkably enough, at low temperatures, this results in a reinforcement of quantum corrections to the conductivity as predicted by recent models of disordered, strongly correlated electronic systems. This finding may provide a simple explanation for the commonly observed¿in conducting oxides-resistivity minima at low temperature. Simultaneously, the ferromagnetic transition occurring at about 140 K, becomes broader as film thickness decreases down to nanometric range. The relevance of these results for the understanding of the electronic properties of disordered electronic systems and for the technological applications of SrRuO3¿and other ferromagnetic and metallic oxides¿is stressed.eng
dc.format.extent8 p.cat
dc.format.mimetypeapplication/pdfeng
dc.language.isoengeng
dc.publisherThe American Physical Societycat
dc.relation.isformatofReproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevB.67.174423cat
dc.relation.ispartofPhysical Review B, 2003, vol. 67, núm. 17, p. 174423-1-174423-8cat
dc.relation.urihttp://dx.doi.org/10.1103/PhysRevB.67.174423-
dc.rights(c) The American Physical Society, 2003cat
dc.sourceArticles publicats en revistes (Física Aplicada)-
dc.subject.classificationSuperfíciescat
dc.subject.classificationPropietats elèctriquescat
dc.subject.otherElectronic structure and electrical properties of surfaceseng
dc.titleEnhanced electron-electron correlations in nanometric epitaxial SrRuO3 epitaxial filmseng
dc.typeinfo:eu-repo/semantics/articleeng
dc.typeinfo:eu-repo/semantics/publishedVersion-
dc.identifier.idgrec506589cat
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess-
Appears in Collections:Articles publicats en revistes (Física Aplicada)

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