Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/115049
Title: Characterization of semiconductor detectors for [gamma]-ray and x-ray spectrometry
Author: Boyer López, Helena
Director/Tutor: Fernández Varea, José María
Keywords: Detectors de radiació
Semiconductors
Treballs de fi de grau
Nuclear counters
Semiconductors
Bachelor's theses
Issue Date: Jan-2017
Abstract: Semiconductor detectors are routinely used in [gamma]-ray and x-ray spectrometry. Their characteriza- tion is crucial in order to perform quantitative analysis. Three steps are needed to this end: energy and FWHM calibration and determination of the full-energy peak effciency. In this TFG we have performed these steps for a HPGe detector. We confirmed the very high linearity, excellent energy resolution and high effciency of the studied spectrometer.
Note: Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Curs: 2017, Tutor: José M. Fernández-Varea
URI: http://hdl.handle.net/2445/115049
Appears in Collections:Treballs Finals de Grau (TFG) - Física

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