Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/124317
Title: Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy
Author: Van Der Hofstadt, Marc
Fabregas, Rene
Biagi, Maria Chiara
Fumagalli, Laura, 1959-
Gomila Lluch, Gabriel
Keywords: Dielèctrics
Nanotecnologia
Microscòpia de força atòmica
Dielectrics
Nanotechnology
Atomic force microscopy
Issue Date: 6-Sep-2016
Publisher: Institute of Physics (IOP)
Abstract: Lift-mode electrostatic force microscopy (EFM) is one of the most convenient imaging modes to study the local dielectric properties of non-planar samples. Here we present the quantitative analysis of this imaging mode. We introduce a method to quantify and subtract the topographic crosstalk from the lift-mode EFM images, and a 3D numerical approach that allows for extracting the local dielectric constant with nanoscale spatial resolution free from topographic artifacts. We demonstrate this procedure by measuring the dielectric properties of micropatterned SiO2 pillars and of single bacteria cells, thus illustrating the wide applicability of our approach from materials science to biology.
Note: Versió postprint del document publicat a: https://doi.org/10.1088/0957-4484/27/40/405706
It is part of: Nanotechnology, 2016, vol. 27, num. 40, p. 405706
URI: http://hdl.handle.net/2445/124317
Related resource: https://doi.org/10.1088/0957-4484/27/40/405706
ISSN: 0957-4484
Appears in Collections:Articles publicats en revistes (Institut de Bioenginyeria de Catalunya (IBEC))
Articles publicats en revistes (Electrònica)

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