Please use this identifier to cite or link to this item:
http://hdl.handle.net/2445/124830| Title: | Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals |
| Author: | León, Máximo Levcenko, Sergiu Serna, Rosalía Bodnar, Ivan V. Nateprov, A. Guc, Maxim Gurieva, G. Lopez, N. Merino, José Manuel Caballero, R. Schorr, S. Pérez Rodríguez, Alejandro Arushanov, Ernest |
| Keywords: | Cristal·lografia El·lipsometria Crystallography Ellipsometry |
| Issue Date: | 15-Aug-2014 |
| Publisher: | American Institute of Physics |
| Abstract: | Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8-4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B interband transitions and were analyzed in frame of the Adachi's model. The interband transition parameters such as strength, threshold energy, and broadening were evaluated by using the simulated annealing algorithm. In addition, the pseudo-complex refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity were derived over 0.8-4.5 eV photon energy range |
| Note: | Reproducció del document publicat a: https://doi.org/10.1063/1.4892548 |
| It is part of: | Applied Physics Letters, 2014, vol. 105, p. 061909-1-061909-4 |
| URI: | http://hdl.handle.net/2445/124830 |
| Related resource: | https://doi.org/10.1063/1.4892548 |
| ISSN: | 0003-6951 |
| Appears in Collections: | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| 645135.pdf | 2.03 MB | Adobe PDF | View/Open |
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