Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/134698
Title: Spectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals
Author: Levcenko, Sergiu
Hajdeu Chicarosh, Elena
Garcia Llamas, Elena
Caballero, Raquel
Serna, Rosalía
Bodnar, Ivan V.
Victorov, Ivan A.
Guc, Maxim
Merino, José Manuel
Pérez Rodríguez, Alejandro
Arushanov, Ernest
León, Máximo
Keywords: El·lipsometria
Dispositius optoelectrònics
Propietats òptiques
Ellipsometry
Optoelectronic devices
Optical properties
Issue Date: 19-Apr-2018
Publisher: American Institute of Physics
Abstract: The linear optical properties of Cu2ZnSnS4 bulk poly-crystals have been investigated using spectroscopic ellipsometry in the range of 1.2-4.6 eV at room temperature. The characteristic features identified in the optical spectra are explained by using the Adachi analytical model for the interband transitions at the corresponding critical points in the Brillouin zone. The experimental data have been modeled over the entire spectral range taking into account the lowest E0 transition near the fundamental absorption edge and E1A and E1B higher energy interband transitions. In addition, the spectral dependences of the refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity values have been accurately determined and are provided since they are essential data for the design of Cu2ZnSnS4 based optoelectronic devices.
Note: Reproducció del document publicat a: https://doi.org/10.1063/1.5024683
It is part of: Applied Physics Letters, 2018, vol. 112, num. 16, p. 161901-1-161901-5
URI: http://hdl.handle.net/2445/134698
Related resource: https://doi.org/10.1063/1.5024683
ISSN: 0003-6951
Appears in Collections:Articles publicats en revistes (Institut de Nanociència i Nanotecnologia (IN2UB))
Articles publicats en revistes (Electrònica)

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