Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/18930
Title: Growth and melting of the nematic phase: sample thickness dependence of the Mullins-Sekerka instability
Author: Ignés i Mullol, Jordi
Oswald, Patrick
Keywords: Estructura cristal·lina (Sòlids)
Cristal·lografia
Pel·lícules fines
Ciència dels materials
Layer structure (Solids)
Crystallography
Thin films
Materials science
Issue Date: 2000
Publisher: The American Physical Society
Abstract: In this article we report our systematic studies of the dependence on the sample thickness of the onset parameters of the instability of the nematic-isotropic interface during directional growth and melting, in homeotropic or planar anchoring.
Note: Reproducció del document publicat a: http://dx.doi.org/10.1103/PhysRevE.61.3969
It is part of: Physical Review E, 2000, vol. 61, núm. 4, p. 3969-3976
URI: http://hdl.handle.net/2445/18930
ISSN: 1063-651X
Appears in Collections:Articles publicats en revistes (Ciència dels Materials i Química Física)

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