Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/22096
Title: Theory of surface noise under Coulomb correlations between carriers and surface states
Author: Kochelap, V. A. (Viacheslav Aleksandrovich)
Sokolov, V. N.
Bulashenko, Oleg
Rubí Capaceti, José Miguel
Keywords: Soroll
Superfícies (Tecnologia)
Camps elèctrics
Circuits de transistors
Semiconductors
Electrònica
Surfaces (Technology)
Electric fields
Transistor circuits
Semiconductors
Electronics
Issue Date: 2002
Publisher: American Institute of Physics
Abstract: We present a theory of the surface noise in a nonhomogeneous conductive channel adjacent to an insulating layer. The theory is based on the Langevin approach which accounts for the microscopic sources of fluctuations originated from trapping¿detrapping processes at the interface and intrachannel electron scattering. The general formulas for the fluctuations of the electron concentration, electric field as well as the current-noise spectral density have been derived. We show that due to the self-consistent electrostatic interaction, the current noise originating from different regions of the conductive channel appears to be spatially correlated on the length scale correspondent to the Debye screening length in the channel. The expression for the Hooge parameter for 1/f noise, modified by the presence of Coulomb interactions, has been derived
Note: Reproducció del document publicat a: http://dx.doi.org/10.1063/1.1512698
It is part of: Journal of Applied Physics, 2002, vol. 92, núm. 9, p. 5347-5358
URI: http://hdl.handle.net/2445/22096
ISSN: null
Appears in Collections:Articles publicats en revistes (Física de la Matèria Condensada)

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