Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/24962
Title: Analysis of S-rich CuIn(S,Se)2 layers for photovoltaic applications: Influence of the sulfurization temperature on the crystalline properties of electrodeposited and sulfurized CuInSe2 precursors
Author: Izquierdo-Roca, Victor
Pérez Rodríguez, Alejandro
Morante i Lleonart, Joan Ramon
Álvarez García, Jacobo
Calvo Barrio, Lorenzo
Bermudez, V.
Grand, P. P.
Parissi, L.
Broussillon, C.
Kerrec, O.
Keywords: Electrònica
Cristal·lografia
Electronics
Crystallography
Issue Date: 23-Jun-2008
Publisher: American Institute of Physics
Abstract: This paper reports the microstructural analysis of S-rich CuIn(S,Se)2 layers produced by electrodeposition of CuInSe2 precursors and annealing under sulfurizing conditions as a function of the temperature of sulfurization. The characterization of the layers by Raman scattering, scanning electron microscopy, Auger electron spectroscopy, and XRD techniques has allowed observation of the strong dependence of the crystalline quality of these layers on the sulfurization temperature: Higher sulfurization temperatures lead to films with improved crystallinity, larger average grain size, and lower density of structural defects. However, it also favors the formation of a thicker MoS2 interphase layer between the CuInS2 absorber layer and the Mo back contact. Decreasing the temperature of sulfurization leads to a significant decrease in the thickness of this intermediate layer and is also accompanied by significant changes in the composition of the interface region between the absorber and the MoS2 layer, which becomes Cu rich. The characterization of devices fabricated with these absorbers corroborates the significant impact of all these features on device parameters as the open circuit voltage and fill factor that determine the efficiency of the solar cells.
Note: Reproducció del document publicat a: http://dx.doi.org/10.1063/1.2939833
It is part of: Journal of Applied Physics, 2008, vol. 103, p. 123109-1-123109-7
Related resource: http://dx.doi.org/10.1063/1.2939833
URI: http://hdl.handle.net/2445/24962
ISSN: 0021-8979
Appears in Collections:Articles publicats en revistes (Electrònica)

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