Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/32145
Title: Precession electron diffraction in the transmission electron Microscope: electron crystallography and orientational mapping
Author: Portillo i Serra, Joaquim
Keywords: Microscòpia electrònica de transmissió
Anàlisi instrumental
Difracció d'electrons
Transmission electron microscopy
Instrumental analysis
Electrons diffraction
Issue Date: 2012
Publisher: Centres Científics i Tecnològics. Universitat de Barcelona
Abstract: Precession electron diffraction (PED) is a hollow cone non-stationary illumination technique for electron diffraction pattern collection under quasikinematical conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique is recently used in TEM instruments of voltages 100 to 300 kV to turn them into true electron iffractometers, thus enabling electron crystallography. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscatter Diffraction (EBSD) technique in Scanning Electron Microscopes (SEM) at lower magnifications and longer acquisition times.
Note: Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166
Note: Reproducció del document original
It is part of: Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.3, 10 p.
Related resource: http://hdl.handle.net/2445/32166
URI: http://hdl.handle.net/2445/32145
Appears in Collections:Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))

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