Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/32147
Title: Advanced applications of scanning electron microscopy in geology
Author: García Veigas, Francisco Javier
Prats Miralles, Eva
Domínguez Ximénez, Anna
Villuendas Latorre, Aránzazu
Keywords: Microscòpia electrònica d'escombratge
Geologia
Anàlisi instrumental
Scanning electron microscopy
Geology
Instrumental analysis
Issue Date: 2012
Publisher: Centres Científics i Tecnològics. Universitat de Barcelona
Abstract: Nowadays Scanning Electron Microscopy (SEM) is a basic and fundamental tool in the study of geologic samples. The collision of a highlyaccelerated electron beam with the atoms of a solid sample results in the production of several radiation types than can be detected and analysed by specific detectors, providing information of the chemistry and crystallography of the studied material. From this point of view, the chamber of a SEM can be considered as a laboratory where different experiments can be carried out. The application of SEM to geology, especially in the fields of mineralogy and petrology has been summarised by Reed (1996).The aim of this paper is to show some recent applications in the characterization of geologic materials.
Note: Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166
Note: Reproducció del document original
It is part of: Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.5, 12 p.
Related resource: http://hdl.handle.net/2445/32166
URI: http://hdl.handle.net/2445/32147
Appears in Collections:Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))

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