Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/32147
Full metadata record
DC FieldValueLanguage
dc.contributor.authorGarcía Veigas, Francisco Javier-
dc.contributor.authorPrats Miralles, Eva-
dc.contributor.authorDomínguez Ximénez, Anna-
dc.contributor.authorVilluendas Latorre, Aránzazu-
dc.date.accessioned2012-09-28T14:15:14Z-
dc.date.available2012-09-28T14:15:14Z-
dc.date.issued2012-
dc.identifier.urihttp://hdl.handle.net/2445/32147-
dc.descriptionPodeu consultar el llibre complet a: http://hdl.handle.net/2445/32166-
dc.description.abstractNowadays Scanning Electron Microscopy (SEM) is a basic and fundamental tool in the study of geologic samples. The collision of a highlyaccelerated electron beam with the atoms of a solid sample results in the production of several radiation types than can be detected and analysed by specific detectors, providing information of the chemistry and crystallography of the studied material. From this point of view, the chamber of a SEM can be considered as a laboratory where different experiments can be carried out. The application of SEM to geology, especially in the fields of mineralogy and petrology has been summarised by Reed (1996).The aim of this paper is to show some recent applications in the characterization of geologic materials.eng
dc.format.extent10 p.-
dc.format.mimetypeapplication/pdf-
dc.language.isoengeng
dc.publisherCentres Científics i Tecnològics. Universitat de Barcelonacat
dc.relation.isformatofReproducció del document original-
dc.relation.ispartofCapítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.5, 12 p.-
dc.relation.urihttp://hdl.handle.net/2445/32166-
dc.rights(c) Universitat de Barcelona, 2012-
dc.sourceLlibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))-
dc.subject.classificationMicroscòpia electrònica d'escombratgecat
dc.subject.classificationGeologiacat
dc.subject.classificationAnàlisi instrumentalcat
dc.subject.otherScanning electron microscopyeng
dc.subject.otherGeologyeng
dc.subject.otherInstrumental analysiseng
dc.titleAdvanced applications of scanning electron microscopy in geologyeng
dc.typeinfo:eu-repo/semantics/bookParteng
dc.typeinfo:eu-repo/semantics/publishedVersion-
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesseng
Appears in Collections:Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))

Files in This Item:
File Description SizeFormat 
MT05 - Advanced applications of SEM_ed2.pdf2.21 MBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.