Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/32165
Title: Secondary Ion Mass Spectrometry (SIMS): principles and applications
Author: López Fernández, Francisco
Keywords: Espectrometria de masses
Anàlisi instrumental
Mass spectrometry
Instrumental analysis
Issue Date: 2012
Publisher: Centres Científics i Tecnològics. Universitat de Barcelona
Abstract: This article outlines the basis of the technique and shows some examples of applications in order to exhibit the expectations of this technique in varied scientific fields.
Note: Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166
Note: Reproducció del document original
It is part of: Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.10, 14 p.
Related resource: http://hdl.handle.net/2445/32166
URI: http://hdl.handle.net/2445/32165
Appears in Collections:Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))

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