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| Issue Date | Title | Author(s) |
|---|---|---|
| 2012 | Limit to the erbium ions emission in silicon-rich oxide films by erbium ion clustering | Prtljaga, Nikola; Navarro Urrios, Daniel; Tengattini, Andrea; Anopchenko, Aleksei; Ramírez Ramírez, Joan Manel; Rebled, J. M. (José Manuel); Estradé Albiol, Sònia; Colonna, Jean-Philippe; Fedeli, Jean-Marc; Garrido Fernández, Blas; Pavesi, Lorenzo |
| 6-Apr-2017 | Simulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO<sub>3</sub> thin films | Coll Benejam, Catalina; López Conesa, Lluís; Rebled, J. M. (José Manuel); Magén, César; Sánchez Barrera, Florencio; Fontcuberta i Griñó, Josep; Estradé Albiol, Sònia; Peiró Martínez, Francisca |