Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/47283
Title: Spectral analysis of the angular distribution function of back reflectors for thin film silicon solar cells
Author: Escarré i Palou, Jordi
Villar, Fernando
Asensi López, José Miguel
Bertomeu i Balagueró, Joan
Andreu i Batallé, Jordi
Keywords: Cèl·lules solars
Pel·lícules fines
Espectroscòpia
Fotons
Òptica
Energia solar
Absorció
Solar cells
Thin films
Spectrum analysis
Photons
Optics
Solar energy
Absorption
Issue Date: 2006
Publisher: Elsevier B.V.
Abstract: Nowadays, one of the most important challenges to enhance the efficiency of thin film silicon solar cells is to increase the short circuit intensity by means of optical confinement methods, such as textured back-reflector structures. In this work, two possible textured structures to be used as back reflectors for n-i-p solar cells have been optically analyzed and compared to a smooth one by using a system which is able to measure the angular distribution function (ADF) of the scattered light in a wide spectral range (350-1000 nm). The accurate analysis of the ADF data corresponding to the reflector structures and to the μc-Si:H films deposited onto them allows the optical losses due to the reflector absorption and its effectiveness in increasing light absorption in the μc-Si:H layer, mainly at long wavelengths, to be quantified.
Note: Versió postprint del document publicat a: http://dx.doi.org/10.1016/j.jnoncrysol.2005.12.046
It is part of: Journal of non-Crystalline Solids, 2006, vol. 352, num. 9-20, p. 1896-1899
Related resource: http://dx.doi.org/10.1016/j.jnoncrysol.2005.12.046
URI: http://hdl.handle.net/2445/47283
ISSN: 0022-3093
Appears in Collections:Articles publicats en revistes (Física Aplicada)

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