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Title: Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation
Author: Arteaga Barriel, Oriol
Baldrís Calmet, Marta
Antó Roca, Joan
Canillas i Biosca, Adolf
Pascual Miralles, Esther
Bertrán Serra, Enric
Keywords: El·lipsometria
Issue Date: 1-Apr-2014
Publisher: Optical Society of America
Abstract: In this paper we describe a new Mueller matrix (MM) microscope that generalizes and makes quantitative the polarized light microscopy technique. In this instrument all the elements of the MU are simultaneously determined from the analysis in the frequency domain of the time-dependent intensity of the light beam at every pixel of the camera. The variations in intensity are created by the two compensators continuously rotating at different angular frequencies. A typical measurement is completed in a little over one minute and it can be applied to any visible wavelength. Some examples are presented to demonstrate the capabilities of the instrument.
Note: Reproducció del document publicat a:
It is part of: Applied Optics, 2014, vol. 53, num. 10, p. 2236-2245
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ISSN: 1559-128X
Appears in Collections:Articles publicats en revistes (Física Aplicada)

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