Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/54288
Title: Multiwavelength excitation Raman scattering study of polycrystalline kesterite Cu2ZnSnS4 thin films
Author: Dimitrievska, Mirjana
Fairbrother, Andrew
Fontané, X.
Jawhari, Tariq
Izquierdo Roca, Victor
Saucedo, Edgardo
Pérez Rodríguez, Alejandro
Keywords: Espectroscòpia Raman
Coure
Termodinàmica
Semiconductors
Raman spectroscopy
Copper
Thermodynamics
Semiconductors
Issue Date: 2014
Publisher: American Institute of Physics
Abstract: This work presents a complete analysis of all Raman active modes of Cu 2ZnSnS4 measuring with six different excitation wavelengths from near infrared to ultraviolet. Simultaneous fitting of spectra allowed identification of 18 peaks from device grade layers with composition close to stoichiometry that are attributed to the 27 optical modes theoretically expected for this crystalline structure, including detection of 5 peaks not observed previously, but theoretically predicted. Resonance effects are assumed to explain the observed increase in intensity of weak modes for near infrared and ultraviolet excitations. These results are particularly relevant for experimental discrimination of Raman modes related to secondary phases.
Note: Reproducció del document publicat a: http://dx.doi.org/10.1063/1.4861593
It is part of: Applied Physics Letters, 2014, vol. 104, p. 021901-1-021901-5
Related resource: http://dx.doi.org/10.1063/1.4861593
URI: http://hdl.handle.net/2445/54288
ISSN: 0003-6951
Appears in Collections:Articles publicats en revistes (Electrònica)

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