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Title: Improving the Lateral Resolution of Quartz Tuning Fork-Based Sensors in Liquid by Integrating Commercial AFM Tips into the Fiber End
Author: Gonzalez Claramonte, Laura
Martínez-Martín, David
Otero, Jorge
José de Pablo, Pedro
Puig i Vidal, Manuel
Gómez-Herrero, Julio
Keywords: Microscòpia de força atòmica
Microscòpia electrònica d'escombratge
Atomic force microscopy
Scanning electron microscopy
Issue Date: 14-Jan-2015
Publisher: MDPI
Abstract: The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own.
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It is part of: Sensors, 2015, vol. 15, p. 1601-1610
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ISSN: 1424-8220
Appears in Collections:Articles publicats en revistes (Electrònica)

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