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Results 21-30 of 56 (Search time: 0.021 seconds).
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Issue DateTitleAuthor(s)
15-Oct-1997Raman microstructural analysis of silicon-on-insulator formed by high dose oxygen ion implantation: As-implanted structuresMacía Santamaría, Javier; Martín, E.; Pérez Rodríguez, Alejandro; Jiménez, J.; Morante i Lleonart, Joan Ramon; Aspar, Bernard; Margail, Jacques
15-May-1997Determination of the direct band-gap energy of InAlAs matched to InP by photoluminescence excitation spectroscopyRoura Grabulosa, Pere; López de Miguel, Manuel; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon
1-May-1997Raman scattering of InSb quantum dots grown on InP substratesArmelles Reig, G.; Utzmeier, Thomas; Postigo Resa, Pablo Aitor; Briones Fernández-Pola, Fernando; Ferrer, J. C.; Peiró Martínez, Francisca; Cornet i Calveras, Albert
1-Apr-1995Spectroscopic characterization of phases formed by high-dose carbon ion implantation in siliconSerre, Christophe; Pérez Rodríguez, Alejandro; Romano Rodríguez, Alberto; Morante i Lleonart, Joan Ramon; Kögler, Reinhard; Skorupa, Wolfgang
1-Jul-1994Electrical transport quantum effects in the In0.53Ga0.47As/In0.52Al0.48As heterostructure on siliconGeorgakilas, Alexander; Christou, Aris; Zekentes, Konstantinos; Mercy, J. M.; Konczewic, L. K.; Vilà i Arbonès, Anna Maria; Cornet i Calveras, Albert
15-Apr-1995Analysis by optical absorption and transmission electron microscopy of the strain inhomogeneities in InGaAs/InP strained layersRoura Grabulosa, Pere; Clark, S. A.; Bosch Estrada, José; Peiró Martínez, Francisca; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon
1997Síntesis de capas de SiC en substrato de Si mediante implantación iónicaPérez, A.; Romano Rodríguez, Alberto; Serre, Christophe; Calvo Barrio, Lorenzo; Cabezas, R.; Morante i Lleonart, Joan Ramon
1997Fotoluminiscencia visible debida a capas de SiO2. implantadas con silicio y carbonoLópez de Miguel, Manuel; Ferré, S.; Pérez-Rodríguez, A.; Ruterana, P.; Morante i Lleonart, Joan Ramon; Garrido Fernández, Blas
1992Micro-Raman study of stress distribution in local isolation structures and correlation with transmission electron microscopyDe Wolf, I.; Vanhellemont, J.; Romano Rodríguez, Alberto; Norström, H.; Maes, H.E.
15-Jan-1996Structure of 60° dislocations at the GaAs/Si interfaceVilà i Arbonès, Anna Maria; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon; Ruterana, Pierre; Loubradou, Marc; Bonnet, Roland