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| Issue Date | Title | Author(s) |
|---|---|---|
| 1-Apr-1995 | Spectroscopic characterization of phases formed by high-dose carbon ion implantation in silicon | Serre, Christophe; Pérez Rodríguez, Alejandro; Romano Rodríguez, Albert; Morante i Lleonart, Joan Ramon; Kögler, Reinhard; Skorupa, Wolfgang |
| 1-Apr-1995 | Strain, alloy composition, and lattice relaxation measured by optical-absorption spectroscopy | Clark, S. A.; Roura Grabulosa, Pere; Bosch Estrada, José; Pérez Rodríguez, Alejandro; Morante i Lleonart, Joan Ramon; Westwood, David I.; Williams, R. H. |
| 15-May-1990 | Characterization of the EL2 center in GaAs by optical admittance spectroscopy | Dueñas Carazo, Salvador; Castán Lanaspa, María Elena; Dios, Agustín de; Bailón Vega, Luis A.; Barbolla Sancho, Juan; Pérez Rodríguez, Alejandro |
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