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Issue Date | Title | Author(s) |
---|---|---|
1-Jun-1998 | Effects of prior hydrogenation on the structure and properties of thermally nanocrystallized silicon layers | Achiq, Abdellatif; Rizk, Richard; Gourbilleau, Fabrice; Madelon, R.; Garrido Fernández, Blas; Pérez Rodríguez, Alejandro; Morante i Lleonart, Joan Ramon |
1-May-1996 | Ion-beam synthesis of amorphous SiC films: Structural analysis and recrystallization | Serre, Christophe; Calvo Barrio, Lorenzo; Pérez Rodríguez, Alejandro; Romano Rodríguez, Albert; Morante i Lleonart, Joan Ramon; Pacaud, Y.; Kögler, Reinhard; Heera, Viton; Skorupa, Wolfgang |
15-Oct-1997 | Raman microstructural analysis of silicon-on-insulator formed by high dose oxygen ion implantation: As-implanted structures | Macía Santamaría, Javier; Martín, E.; Pérez Rodríguez, Alejandro; Jiménez, J.; Morante i Lleonart, Joan Ramon; Aspar, Bernard; Margail, Jacques |
1-Jul-2003 | White luminescence from Si+ and C+ ion-implanted SiO2 films | Pérez Rodríguez, Alejandro; González Varona, Olga; Garrido Fernández, Blas; Pellegrino, Paolo; Morante i Lleonart, Joan Ramon |
22-May-2007 | Raman microprobe characterization of electrodeposited S-rich CuIn(S,Se)2 for photovoltaic applications: Microstructural analysis | Izquierdo Roca, Victor; Pérez Rodríguez, Alejandro; Romano Rodríguez, Albert; Morante i Lleonart, Joan Ramon; Álvarez García, Jacobo; Calvo Barrio, Lorenzo; Bermudez, V.; Grand, P. P.; Ramdani, O.; Parissi, L.; Kerrec, O. |
15-Nov-1996 | Effect of stress and composition on the Raman spectra of etch-stop SiGeB layers | Pérez Rodríguez, Alejandro; Romano Rodríguez, Albert; Cabezas, R.; Morante i Lleonart, Joan Ramon; Jawhari, Tariq; Hunt, Charles E. |
1-Apr-1995 | Spectroscopic characterization of phases formed by high-dose carbon ion implantation in silicon | Serre, Christophe; Pérez Rodríguez, Alejandro; Romano Rodríguez, Albert; Morante i Lleonart, Joan Ramon; Kögler, Reinhard; Skorupa, Wolfgang |
1-Apr-1995 | Strain, alloy composition, and lattice relaxation measured by optical-absorption spectroscopy | Clark, S. A.; Roura Grabulosa, Pere; Bosch Estrada, José; Pérez Rodríguez, Alejandro; Morante i Lleonart, Joan Ramon; Westwood, David I.; Williams, R. H. |
15-Jan-2002 | Influence of average size and interface passivation on the spectral emission of Si nanocrystals embedded in SiO2 | Garrido Fernández, Blas; López de Miguel, Manuel; García, C.; Pérez Rodríguez, Alejandro; Morante i Lleonart, Joan Ramon; Bonafos, Caroline; Carrada, Marzia; Claverie, Alain |
23-Jun-2008 | Analysis of S-rich CuIn(S,Se)2 layers for photovoltaic applications: Influence of the sulfurization temperature on the crystalline properties of electrodeposited and sulfurized CuInSe2 precursors | Izquierdo Roca, Victor; Pérez Rodríguez, Alejandro; Morante i Lleonart, Joan Ramon; Álvarez García, Jacobo; Calvo Barrio, Lorenzo; Bermudez, V.; Grand, P. P.; Parissi, L.; Broussillon, C.; Kerrec, O. |
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