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| Issue Date | Title | Author(s) |
|---|---|---|
| 1-Dec-1984 | Reconstruction of the SiO2 structure damaged by low-energy Ar-implanted ions | Garrido Fernández, Blas; Samitier i Martí, Josep; Bota Ferragut, Sebastián Antonio; Moreno, J. A.; Montserrat i Martí, Josep; Morante i Lleonart, Joan Ramon |
| 1986 | Majority carrier capture cross section determination in the large deep trap concentration cases | Morante i Lleonart, Joan Ramon; Samitier i Martí, Josep; Cornet i Calveras, Albert; Herms Berenguer, Atilà; Cartujo Estébanez, Pedro |
| 1986 | Analysis of the near-intrinsic and extrinsic photocapacitance due to the EL2 level in boron implanted GaAs | Morante i Lleonart, Joan Ramon; Samitier i Martí, Josep; Pérez Rodríguez, Alejandro; Altelarrea Soria, Hermenegildo; Gourrier, S. |
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