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Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/8502
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dc.contributor.authorDellunde i Clavé, Jaumecat
dc.contributor.authorTorrent, M. C. (Maria Carme)cat
dc.contributor.authorSancho, José M.cat
dc.contributor.authorShore, K. A.cat
dc.date.accessioned2009-06-03T12:02:36Z-
dc.date.available2009-06-03T12:02:36Z-
dc.date.issued1997cat
dc.identifier.issn0018-9197cat
dc.identifier.urihttp://hdl.handle.net/2445/8502-
dc.description.abstractThe turn-on process of a multimode VCSEL is investigated from a statistical point of view. Special attention is paid to quantities such as time jitter and bit error rate. The single-mode performance of VCSEL¿s during current modulation is compared to that of edge-emitting lasers.eng
dc.format.extent8 p.cat
dc.format.mimetypeapplication/pdfeng
dc.language.isoengeng
dc.publisherIEEEcat
dc.relation.isformatofReproducció del document publicat a http://dx.doi.org/10.1109/3.594885cat
dc.relation.ispartofIEEE Journal of Quantum Electronics, 1997, vol. 33, núm. 7, p. 1197-1204.cat
dc.relation.urihttp://dx.doi.org/10.1109/3.594885-
dc.rights(c) IEEE, 1997eng
dc.sourceArticles publicats en revistes (Física Quàntica i Astrofísica)-
dc.subject.classificationDinàmicacat
dc.subject.classificationLàsers de semiconductorscat
dc.subject.classificationEstadísticacat
dc.subject.otherDynamicseng
dc.subject.otherSemiconductor laserseng
dc.subject.otherStatisticseng
dc.titleStatistics of transverse mode turn-on dynamics in VCSEL'seng
dc.typeinfo:eu-repo/semantics/articleeng
dc.typeinfo:eu-repo/semantics/publishedVersion-
dc.identifier.idgrec118390cat
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess-
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