Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/96259
Title: Characterization of crystallographic defects in LaNiO3 through TEM image simulations
Author: Bastons Garcia, Joan Carles
Director: Estradé Albiol, Sònia
Coll Benejam, Catalina
Keywords: Lantani
Defectes cristal·lins
Tesis
Simulació per ordinador
Lanthanum
Crystals defects
Theses
Computer simulation
Issue Date: Jan-2016
Abstract: Lanthanum nickel oxide, LaNiO3, is often used as an electrode in many electronic devices due to its low resistivity. The study of its properties requires understanding them in the nanoscale and, for this purpose, the electron transmission microscope is an indispensable tool. In the present work, we aim to examine the defects observed in High Angular Annular Dark Field (HAADF) images of a lanthanum nickel oxide thin film grown epitaxially on a lanthanum aluminate substrate. For this end, High Resolution Transmission Electron Microscopy (HRTEM) and HAADF images are simulated following the multislice method, implemented by Temsim, a software provided freely by E.J. Kirkland. Results show that the multislice method is a powerful tool so as to interpret the defects in the structure
Note: Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Curs: 2016, Tutores: Sònia Estradé Albiol and Catalina Coll Benejam
URI: http://hdl.handle.net/2445/96259
Appears in Collections:Treballs Finals de Grau (TFG) - Física

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