Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/98142
Title: Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
Author: Barroso, F.
Bosch i Puig, Salvador
Tort Escribà, Núria
Arteaga Barriel, Oriol
Sancho i Parramon, Jordi
Jover, Eric
Bertran Serra, Enric
Canillas i Biosca, Adolf
Keywords: El·lipsometria
Nanoestructures
Interferometria
Ellipsometry
Nanostructures
Interferometry
Issue Date: 17-Dec-2010
Publisher: Elsevier B.V.
Abstract: We introduce a new measurement system called Nanopolar interferometer devoted to monitor and characterize single nanoparticles which is based on the interferometric phase modulated ellipsometry technique. The system collects the backscattered light by the particles in the solid angle subtended by a microscope objective and then analyses its frequency components. The results for the detection of 2 μm and 50 nm particles are explained in terms of a cross polarization effect of the polarization vectors when the beam converts from divergent to parallel in the microscope objective. This explanation is supported with the results of the optical modelling using the exact Mie theory for the light scattered by the particles.
Note: Versió postprint del document publicat a: http://dx.doi.org/10.1016/j.tsf.2010.12.051
It is part of: Thin Solid Films, 2010, vol. 519, p. 2801-2805
Related resource: http://dx.doi.org/10.1016/j.tsf.2010.12.051
URI: http://hdl.handle.net/2445/98142
ISSN: 0040-6090
Appears in Collections:Articles publicats en revistes (Física Aplicada)

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