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http://hdl.handle.net/2445/98783
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DC Field | Value | Language |
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dc.contributor.author | Janicki, V. | - |
dc.contributor.author | Sancho i Parramon, Jordi | - |
dc.contributor.author | Bosch i Puig, Salvador | - |
dc.contributor.author | Zorc, H. | - |
dc.contributor.author | Belarre, F. J. | - |
dc.contributor.author | Arbiol i Cobos, Jordi | - |
dc.date.accessioned | 2016-05-24T07:40:25Z | - |
dc.date.available | 2016-05-24T07:40:25Z | - |
dc.date.issued | 2014 | - |
dc.identifier.issn | 0947-8396 | - |
dc.identifier.uri | http://hdl.handle.net/2445/98783 | - |
dc.description.abstract | Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements. | - |
dc.format.extent | 6 p. | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | Springer Verlag | - |
dc.relation.isformatof | Versió postprint del document publicat a: http://dx.doi.org/10.1007/s00339-013-8056-x | - |
dc.relation.ispartof | Applied Physics A-Materials Science & Processing, 2014, vol. 115, num. 2, p. 481-486 | - |
dc.relation.uri | http://dx.doi.org/10.1007/s00339-013-8056-x | - |
dc.rights | (c) Springer Verlag, 2014 | - |
dc.source | Articles publicats en revistes (Física Aplicada) | - |
dc.subject.classification | Ressonància de plasmons superficials | - |
dc.subject.classification | Pel·lícules metàl·liques | - |
dc.subject.classification | El·lipsometria | - |
dc.subject.other | Surface plasmon resonance | - |
dc.subject.other | Metallic films | - |
dc.subject.other | Ellipsometry | - |
dc.title | Metal island film-based structures for sensing using spectrophotometry and ellipsometry | - |
dc.type | info:eu-repo/semantics/article | - |
dc.type | info:eu-repo/semantics/acceptedVersion | - |
dc.identifier.idgrec | 629697 | - |
dc.date.updated | 2016-05-18T14:34:34Z | - |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | - |
Appears in Collections: | Articles publicats en revistes (Física Aplicada) |
Files in This Item:
File | Description | Size | Format | |
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629697.pdf | 531.42 kB | Adobe PDF | View/Open |
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