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https://hdl.handle.net/2445/10601
Title: | Fractional exclusion statistics and shot noise in ballistic conductors |
Author: | Gomila Lluch, Gabriel Reggiani, L. (Lino), 1941- |
Keywords: | Fluctuations (Physics) Soroll electrònic Semiconductors Fluctuacions (Física) Electronic noise Semiconductors |
Issue Date: | 2001 |
Publisher: | The American Physical Society |
Abstract: | We study the noise properties of ballistic conductors with carriers satisfying fractional exclusion statistics. To test directly the nature of exclusion statistics we found that systems under weakly degenerate conditions should be considered. Typical of these systems is that the chemical potential $\ensuremath{\mu}$ is in the thermal range $|\ensuremath{\mu}|l{3k}_{B}T.$ In these conditions the noise properties under current saturation are found to depend upon the statistical parameter g, displaying suppressed shot noise for $1/2l~gl~1,$ and enhanced shot noise for $0lgl1/2,$ according to the attractive or repulsive nature of the carrier exclusion statistics. |
Note: | Reproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevB.63.165404 |
It is part of: | Physical Review B, 2001, vol. 63, núm. 16, p. 165404-1-165404-6 |
URI: | https://hdl.handle.net/2445/10601 |
Related resource: | http://doi.org/10.1103/PhysRevB.63.165404 |
ISSN: | 0163-1829 |
Appears in Collections: | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) |
Files in This Item:
File | Description | Size | Format | |
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526802.pdf | 77.28 kB | Adobe PDF | View/Open |
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