Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/10630
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dc.contributor.authorRosini, M.cat
dc.contributor.authorReggiani, L. (Lino), 1941-cat
dc.contributor.authorGomila Lluch, Gabrielcat
dc.date.accessioned2009-12-29T10:55:15Z-
dc.date.available2009-12-29T10:55:15Z-
dc.date.issued2007cat
dc.identifier.issn0163-1829cat
dc.identifier.urihttp://hdl.handle.net/2445/10630-
dc.description.abstractWithin a drift-diffusion model we investigate the role of the self-consistent electric field in determining the impedance field of a macroscopic Ohmic (linear) resistor made by a compensated semi-insulating semiconductor at arbitrary values of the applied voltage. The presence of long-range Coulomb correlations is found to be responsible for a reshaping of the spatial profile of the impedance field. This reshaping gives a null contribution to the macroscopic impedance but modifies essentially the transition from thermal to shot noise of a macroscopic linear resistor. Theoretical calculations explain a set of noise experiments carried out in semi-insulating CdZnTe detectors.eng
dc.format.extent9 p.cat
dc.format.mimetypeapplication/pdfeng
dc.language.isoengeng
dc.publisherThe American Physical Societycat
dc.relation.isformatofReproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevB.75.045209cat
dc.relation.ispartofPhysical Review B, 2007, vol. 75, núm. 4, p. 045209-1-045209-9cat
dc.relation.urihttp://dx.doi.org/10.1103/PhysRevB.75.045209-
dc.rights(c) The American Physical Society, 2007cat
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)-
dc.subject.classificationFísica de l'estat sòlidcat
dc.subject.classificationElectrònica quànticacat
dc.subject.otherElectronic transport in condensed mattereng
dc.subject.otherElectronic structure and electrical properties of surfaceseng
dc.subject.otherQuantum electronicseng
dc.titleImpedance field and transition from thermal to shot noise in Cd1-xZnxTe semi-insulating Ohmic detectorseng
dc.typeinfo:eu-repo/semantics/articleeng
dc.typeinfo:eu-repo/semantics/publishedVersion-
dc.identifier.idgrec550004cat
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess-
Appears in Collections:Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)

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