Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/124830
Full metadata record
DC FieldValueLanguage
dc.contributor.authorLeón, Máximo-
dc.contributor.authorLevcenko, Sergiu-
dc.contributor.authorSerna, Rosalía-
dc.contributor.authorBodnar, Ivan V.-
dc.contributor.authorNateprov, A.-
dc.contributor.authorGuc, Maxim-
dc.contributor.authorGurieva, G.-
dc.contributor.authorLopez, N.-
dc.contributor.authorMerino, José Manuel-
dc.contributor.authorCaballero, Raquel-
dc.contributor.authorSchorr, S.-
dc.contributor.authorPérez Rodríguez, Alejandro-
dc.contributor.authorArushanov, Ernest-
dc.date.accessioned2018-09-26T10:40:18Z-
dc.date.available2018-09-26T10:40:18Z-
dc.date.issued2014-08-15-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/2445/124830-
dc.description.abstractUsing spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8-4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B interband transitions and were analyzed in frame of the Adachi's model. The interband transition parameters such as strength, threshold energy, and broadening were evaluated by using the simulated annealing algorithm. In addition, the pseudo-complex refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity were derived over 0.8-4.5 eV photon energy range-
dc.format.extent5 p.-
dc.format.mimetypeapplication/pdf-
dc.language.isoeng-
dc.publisherAmerican Institute of Physics-
dc.relation.isformatofReproducció del document publicat a: https://doi.org/10.1063/1.4892548-
dc.relation.ispartofApplied Physics Letters, 2014, vol. 105, p. 061909-1-061909-4-
dc.relation.urihttps://doi.org/10.1063/1.4892548-
dc.rights(c) American Institute of Physics , 2014-
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)-
dc.subject.classificationCristal·lografia-
dc.subject.classificationEl·lipsometria-
dc.subject.otherCrystallography-
dc.subject.otherEllipsometry-
dc.titleSpectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals-
dc.typeinfo:eu-repo/semantics/article-
dc.typeinfo:eu-repo/semantics/publishedVersion-
dc.identifier.idgrec645135-
dc.date.updated2018-09-26T10:40:18Z-
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess-
Appears in Collections:Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)

Files in This Item:
File Description SizeFormat 
645135.pdf2.03 MBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.