Please use this identifier to cite or link to this item:
http://hdl.handle.net/2445/124987
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Coll Benejam, Catalina | - |
dc.contributor.author | López Conesa, Lluís | - |
dc.contributor.author | Rebled, J. M. (José Manuel) | - |
dc.contributor.author | Magén, César | - |
dc.contributor.author | Sánchez Barrera, Florencio | - |
dc.contributor.author | Fontcuberta i Griñó, Josep | - |
dc.contributor.author | Estradé Albiol, Sònia | - |
dc.contributor.author | Peiró Martínez, Francisca | - |
dc.date.accessioned | 2018-10-02T09:34:10Z | - |
dc.date.available | 2018-10-02T09:34:10Z | - |
dc.date.issued | 2017-04-06 | - |
dc.identifier.issn | 1932-7447 | - |
dc.identifier.uri | http://hdl.handle.net/2445/124987 | - |
dc.description.abstract | LaNiO3 (LNO) thin films are widely used as electrode materials. Yet, their properties greatly depend on such parameters as strain state and defect density. In this work we present a detailed structural characterization of epitaxial LNO thin films grown on LaAlO3(001). Based on scanning transmission electron microscope - high-angle annular darkfield imaging (STEM-HAADF) contrast analysis and image simulations, Ruddlesden-Popper faulted configurations, with 1/2a<111> relative displacement of defect free perovskite blocks, are atomically modeled and simulated to disentangle the variation of Z-contrast in the experimental images | - |
dc.format.extent | 5 p. | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | American Chemical Society | - |
dc.relation.isformatof | Versió postprint del document publicat a: https://doi.org/10.1021/acs.jpcc.6b12484 | - |
dc.relation.ispartof | Journal of Physical Chemistry C, 2017, vol. 121, num. 17, p. 9300-9304 | - |
dc.relation.uri | https://doi.org/10.1021/acs.jpcc.6b12484 | - |
dc.rights | (c) American Chemical Society , 2017 | - |
dc.source | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) | - |
dc.subject.classification | Pel·lícules fines | - |
dc.subject.other | Thin films | - |
dc.title | Simulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO<sub>3</sub> thin films | - |
dc.type | info:eu-repo/semantics/article | - |
dc.type | info:eu-repo/semantics/acceptedVersion | - |
dc.identifier.idgrec | 671835 | - |
dc.date.updated | 2018-10-02T09:34:10Z | - |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | - |
Appears in Collections: | Articles publicats en revistes (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
671835.pdf | 776.24 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.