Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/13170
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dc.contributor.authorGomila Lluch, Gabrielcat
dc.contributor.authorPennetta, C.cat
dc.contributor.authorReggiani, L. (Lino), 1941-cat
dc.contributor.authorFerrari, G.cat
dc.contributor.authorSampietro, M.cat
dc.contributor.authorBertuccio, G.cat
dc.date.accessioned2010-06-25T08:26:54Z-
dc.date.available2010-06-25T08:26:54Z-
dc.date.issued2004-
dc.identifier.issn0031-9007-
dc.identifier.urihttp://hdl.handle.net/2445/13170-
dc.description.abstractWe report on direct experimental evidence of shot noise in a linear macroscopic resistor. The origin of the shot noise comes from the fluctuation of the total number of charge carriers inside the resistor associated with their diffusive motion under the condition that the dielectric relaxation time becomes longer than the dynamic transit time. The present results show that neither potential barriers nor the absence of inelastic scattering are necessary to observe shot noise in electronic devices.eng
dc.format.extent4 p.-
dc.format.mimetypeapplication/pdf-
dc.language.isoengeng
dc.publisherAmerican Physical Societycat
dc.relation.isformatofReproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevLett.92.226601cat
dc.relation.ispartofPhysical Review Letters, 2004, vol. 92, núm. 22, p. 226601-1-226601-4cat
dc.relation.urihttp://dx.doi.org/10.1103/PhysRevLett.92.226601-
dc.rights(c) American Physical Society, 2004cat
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)-
dc.subject.classificationEnginyeria elèctricacat
dc.subject.otherElectric engineeringeng
dc.titleShot noise in linear macroscopic resistorseng
dc.typeinfo:eu-repo/semantics/articleeng
dc.typeinfo:eu-repo/semantics/publishedVersion-
dc.identifier.idgrec526813-
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess-
Appears in Collections:Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)

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