Please use this identifier to cite or link to this item:
https://hdl.handle.net/2445/24296
Title: | Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization |
Author: | Sancho i Parramon, Jordi Ferré Borrull, Josep Bosch i Puig, Salvador Ferrara, Maria Christina |
Keywords: | Òptica electrònica Electron optics |
Issue Date: | 2003 |
Publisher: | Optical Society of America |
Abstract: | We present a procedure for the optical characterization of thin-film stacks from spectrophotometric data. The procedure overcomes the intrinsic limitations arising in the numerical determination of many parameters from reflectance or transmittance spectra measurements. The key point is to use all the information available from the manufacturing process in a single global optimization process. The method is illustrated by a case study of solgel applications. |
Note: | Reproducció del document publicat a: http://dx.doi.org/10.1364/AO.42.001325 |
It is part of: | Applied Optics, 2004, vol. 42, núm. 7, p. 1325-1329 |
URI: | https://hdl.handle.net/2445/24296 |
Related resource: | http://dx.doi.org/10.1364/AO.42.001325 |
ISSN: | 0003-6935 |
Appears in Collections: | Articles publicats en revistes (Física Aplicada) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
505505.pdf | 86.76 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.