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DC Field | Value | Language |
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dc.contributor.author | Moreno Pastor, José Antonio | cat |
dc.contributor.author | Garrido Fernández, Blas | cat |
dc.contributor.author | Pellegrino, Paolo | cat |
dc.contributor.author | García Favrot, Cristina | cat |
dc.contributor.author | Arbiol i Cobos, Jordi | cat |
dc.contributor.author | Morante i Lleonart, Joan Ramon | cat |
dc.contributor.author | Marie, P. | cat |
dc.contributor.author | Gourbilleau, Fabrice | cat |
dc.contributor.author | Rizk, Richard | cat |
dc.date.accessioned | 2012-05-03T11:20:46Z | - |
dc.date.available | 2012-05-03T11:20:46Z | - |
dc.date.issued | 2005-07-08 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/2445/24864 | - |
dc.description.abstract | he complex refractive index of SiO2 layers containing Si nanoclusters (Si-nc) has been measured by spectroscopic ellipsometry in the range from 1.5 to 5.0 eV. It has been correlated with the amount of Si excess accurately measured by x-ray photoelectron spectroscopy and the nanocluster size determined by energy-filtered transmission electron microscopy. The Si-nc embedded in SiO2 have been produced by a fourfold Si+ ion implantation, providing uniform Si excess aimed at a reliable ellipsometric modeling. The complex refractive index of the Si-nc phase has been calculated by the application of the Bruggeman effective-medium approximation to the composite media. The characteristic resonances of the refractive index and extinction coefficient of bulk Si vanish out in Si-nc. In agreement with theoretical simulations, a significant reduction of the refractive index of Si-nc is observed, in comparison with bulk and amorphous silicon. The knowledge of the optical properties of these composite layers is crucial for the realization of Si-based waveguides and light-emitting devices. | eng |
dc.format.extent | 4 p. | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | eng |
dc.publisher | American Institute of Physics | - |
dc.relation.isformatof | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.1943512 | - |
dc.relation.ispartof | Journal of Applied Physics, 2005, vol. 98, núm. 1, p. 013523-013526 | - |
dc.relation.uri | http://dx.doi.org/10.1063/1.1943512 | - |
dc.rights | (c) American Institute of Physics, 1984 | - |
dc.source | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) | - |
dc.subject.classification | Propietats òptiques | cat |
dc.subject.classification | Matèria condensada | cat |
dc.subject.classification | Espectroscòpia | cat |
dc.subject.classification | Cristal·lografia | cat |
dc.subject.other | Optical properties | eng |
dc.subject.other | Condensed matter | eng |
dc.subject.other | Spectrum analysis | eng |
dc.subject.other | Crystallography | eng |
dc.title | Size dependence of refractive index of Si nanoclusters embedded in SiO2 | eng |
dc.type | info:eu-repo/semantics/article | - |
dc.type | info:eu-repo/semantics/publishedVersion | - |
dc.identifier.idgrec | 527385 | - |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | - |
Appears in Collections: | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) |
Files in This Item:
File | Description | Size | Format | |
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527385.pdf | 81.85 kB | Adobe PDF | View/Open |
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