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Title: Nanomechanical properties of molecular organic thin films
Author: Caro, J.
Fraxedas i Calduch, Jordi
Gorostiza Langa, Pablo Ignacio
Sanz Carrasco, Fausto
Keywords: Pel·lícules fines
Microscòpia de força atòmica
Thin films
Atomic force microscopy
Issue Date: Jul-2001
Publisher: American Institute of Physics
Abstract: Using atomic force microscopy we have studied the nanomechanical response to nanoindentations of surfaces of highly oriented molecular organic thin films (thickness¿1000¿nm). The Young¿s modulus E can be estimated from the elastic deformation using Hertzian mechanics. For the quasi-one-dimensional metal tetrathiafulvalene tetracyanoquinodimethane E~20¿GPa and for the ¿ phase of the p-nitrophenyl nitronyl nitroxide radical E~2GPa. Above a few GPa, the surfaces deform plastically as evidenced by discrete discontinuities in the indentation curves associated to molecular layers being expelled by the penetrating tip.
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It is part of: Journal of Vacuum Science Technology A-Vacuum Surfaces and Films, 2001, vol. 19, p. 1825-1828
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ISSN: 0021-8979
Appears in Collections:Articles publicats en revistes (Ciència dels Materials i Química Física)

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