Please use this identifier to cite or link to this item:
Title: Nanoscale capacitance microscopy of thin dielectric films
Author: Gomila Lluch, Gabriel
Toset Gilabert, Jorge
Fumagalli, Laura, 1959-
Keywords: Dielèctrics
Issue Date: 25-Jul-2008
Publisher: American Institute of Physics
Abstract: We present an analytical model to interpret nanoscale capacitance microscopy measurements on thin dielectric films. The model displays a logarithmic dependence on the tip-sample distance and on the film thickness-dielectric constant ratio and shows an excellent agreement with finite-element numerical simulations and experimental results on a broad range of values. Based on these results, we discuss the capabilities of nanoscale capacitance microscopy for the quantitative extraction of the dielectric constant and the thickness of thin dielectric films at the nanoscale.
Note: Reproducció del document publicat a:
It is part of: Journal of Applied Physics, 2008, vol. 104, núm. 2, p. 024315
Related resource:
ISSN: 0021-8979
Appears in Collections:Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
Articles publicats en revistes (Institut de Bioenginyeria de Catalunya (IBEC))

Files in This Item:
File Description SizeFormat 
561608.pdf513.25 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.