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Title: On the artificial creation of the EL2 center by means of boron implantation in gallium arsenide
Author: Morante i Lleonart, Joan Ramon
Pérez Rodríguez, Alejandro
Samitier i Martí, Josep
Romano Rodríguez, Albert
Keywords: Materials
Estructura electrònica
Matèria condensada
Electronic structure
Condensed matter
Issue Date: 1991
Publisher: American Institute of Physics
Abstract: In the present work, an analysis of the dark and optical capacitance transients obtained from Schottky Au:GaAs barriers implanted with boron has been carried out by means of the isothermal transient spectroscopy (ITS) and differential and optical ITS techniques. Unlike deep level transient spectroscopy, the use of these techniques allows one to easily distinguish contributions to the transients different from those of the usual deep trap emission kinetics. The results obtained show the artificial creation of the EL2, EL6, and EL5 defects by the boron implantation process. Moreover, the interaction mechanism between the EL2 and other defects, which gives rise to the U band, has been analyzed. The existence of a reorganization process of the defects involved has been observed, which prevents the interaction as the temperature increases. The activation energy of this process has been found to be dependent on the temperature of the annealing treatment after implantation, with values of 0.51 and 0.26 eV for the as‐implanted and 400 °C annealed samples, respectively. The analysis of the optical data has corroborated the existence of such interactions involving all the observed defects that affect their optical parameters
Note: Reproducció del document publicat a:
It is part of: Journal of Applied Physics, 1991, vol. 70, num. 8, p. 4202-4210
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ISSN: 0021-8979
Appears in Collections:Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)

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