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http://hdl.handle.net/2445/32219| Title: | Alloy inhomogeneities in InAlAs strained layers grown by MBE |
| Author: | Peiró Martínez, Francisca Cornet i Calveras, Albert Morante i Lleonart, Joan Ramon Clark, S. A. Williams, R. H. |
| Keywords: | Microscòpia electrònica Pel·lícules fines Feixos moleculars Electron microscopy Thin films Molecular beams |
| Issue Date: | 1992 |
| Publisher: | American Institute of Physics |
| Abstract: | Transmission electron microscopy studies have been performed to characterize InxAl1−xAs layers grown by molecular beam epitaxy on (100) InP substrates. The first observations of compositional nonuniformities in strained InAlAs layers are reported. The coarse quasiperiodic structure present in each sample has been found to be dependent upon the growth parameters and the sample characteristics. |
| Note: | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.351083 |
| It is part of: | Journal of Applied Physics, 1992, vol. 71, num. 5, p. 2470-2472 |
| URI: | http://hdl.handle.net/2445/32219 |
| Related resource: | http://dx.doi.org/10.1063/1.351083 |
| ISSN: | 0021-8979 |
| Appears in Collections: | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 061619.pdf | 321.49 kB | Adobe PDF | View/Open |
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