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| Issue Date | Title | Author(s) |
|---|---|---|
| 1999 | Investigation of defect formation and electronic transport in microcrystalline silicon deposited by hot-wire CVD | Stöger, M.; Breymesser, A.; Schlosser, V.; Ramadori, M.; Plunger, V.; Peiró, D.; Voz Sánchez, Cristóbal; Bertomeu i Balagueró, Joan; Nelhiebel, M.; Schattschneider, P.; Andreu i Batallé, Jordi |
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- 1 1999