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Issue Date | Title | Author(s) |
---|---|---|
1996 | New features of the layer-by-layer deposition of microcrystalline silicon films revealed by spectroscopic ellipsometry and high resolution transmission electron microscopy | Roca i Cabarrocas, P. (Pere); Hamma, S.; Hadjadj, A.; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi |