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| Issue Date | Title | Author(s) |
|---|---|---|
| 2000 | Thin Film Transistors obtained by Hot-Wire CVD | Puigdollers i González, Joaquim; Orpella, Albert; Dosev, D.; Voz Sánchez, Cristóbal; Pallarés Curto, Jordi; Marsal Garví, Lluís F. (Lluís Francesc); Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi; Alcubilla González, Ramón; Peiró, D. |
| 2003 | Surface passivation of crystalline silicon by Cat-CVD amorphous and nanocrystalline thin silicon films | Voz Sánchez, Cristóbal; Martin Garcia, Isidro; Orpella, Albert; Puigdollers i González, Joaquim; Vetter, M.; Alcubilla González, Ramón; Soler Vilamitjana, David; Fonrodona Turon, Marta; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi |
| 2003 | Substrate influence on the properties of doped thin silicon layers grown by Cat-CVD | Soler Vilamitjana, David; Fonrodona Turon, Marta; Voz Sánchez, Cristóbal; Asensi López, José Miguel; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi |
| 2002 | Electronic transport in low temperature nanocrystalline silicon thin-film transistors obtained by Hot-Wire CVD | Puigdollers i González, Joaquim; Voz Sánchez, Cristóbal; Orpella, Albert; Martin Garcia, Isidro; Soler Vilamitjana, David; Fonrodona Turon, Marta; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi; Alcubilla González, Ramón |
| 2001 | Analysis of bias stress on thin-film transistors obtained by Hot-Wire Chemical Vapour Deposition | Dosev, D.; Puigdollers i González, Joaquim; Orpella, Albert; Voz Sánchez, Cristóbal; Fonrodona Turon, Marta; Soler Vilamitjana, David; Marsal Garví, Lluís F. (Lluís Francesc); Pallarés Curto, Jordi; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi; Alcubilla González, Ramón |
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