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Title: Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
Author: Barroso, F.
Bosch i Puig, Salvador
Tort Escribà, Núria
Arteaga Barriel, Oriol
Sancho i Parramon, Jordi
Jover, Eric
Bertrán Serra, Enric
Canillas i Biosca, Adolf
Keywords: El·lipsometria
Issue Date: 17-Dec-2010
Publisher: Elsevier B.V.
Abstract: We introduce a new measurement system called Nanopolar interferometer devoted to monitor and characterize single nanoparticles which is based on the interferometric phase modulated ellipsometry technique. The system collects the backscattered light by the particles in the solid angle subtended by a microscope objective and then analyses its frequency components. The results for the detection of 2 μm and 50 nm particles are explained in terms of a cross polarization effect of the polarization vectors when the beam converts from divergent to parallel in the microscope objective. This explanation is supported with the results of the optical modelling using the exact Mie theory for the light scattered by the particles.
Note: Versió postprint del document publicat a:
It is part of: Thin Solid Films, 2010, vol. 519, p. 2801-2805
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ISSN: 0040-6090
Appears in Collections:Articles publicats en revistes (Física Aplicada)

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