Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/9851
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dc.contributor.authorAsensi López, José Miguelcat
dc.contributor.authorAndreu i Batallé, Jordicat
dc.date.accessioned2009-10-28T09:34:18Z-
dc.date.available2009-10-28T09:34:18Z-
dc.date.issued1993cat
dc.identifier.issn0163-1829cat
dc.identifier.urihttp://hdl.handle.net/2445/9851-
dc.description.abstractA general and straightforward analytical expression for the defect-state-energy distribution of a-Si:H is obtained through a statistical-mechanical treatment of the hydrogen occupation for different sites. Broadening of available defect energy levels (defect pool) and their charge state, both in electronic equilibrium and nonequilibrium steady-state situations, are considered. The model gives quantitative results that reproduce different defect phenomena, such as the thermally activated spin density, the gap-state dependence on the Fermi level, and the intensity and temperature dependence of light-induced spin density. An interpretation of the Staebler-Wronski effect is proposed, based on the ''conversion'' of shallow charged centers to neutrals near the middle of the gap as a consequence of hydrogen redistribution.eng
dc.format.extent9 p.cat
dc.format.mimetypeapplication/pdfeng
dc.language.isoengeng
dc.publisherThe American Physical Societyeng
dc.relation.isformatofReproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevB.47.13295cat
dc.relation.ispartofPhysical Review B, 1993, vol. 47, núm. 20, p. 13295-13303.eng
dc.relation.urihttp://dx.doi.org/10.1103/PhysRevB.47.13295-
dc.rights(c) The American Physical Society, 1993eng
dc.sourceArticles publicats en revistes (Física Aplicada)-
dc.subject.classificationConductivitat elèctricacat
dc.subject.classificationPropietats tèrmiquescat
dc.subject.classificationSemiconductors amorfscat
dc.subject.otherElectric conductivityeng
dc.subject.otherThermal propertieseng
dc.subject.otherAmorphous semiconductorseng
dc.titleEquilibrium and nonequilibrium gap-state distribution in amorphous siliconeng
dc.typeinfo:eu-repo/semantics/articleeng
dc.typeinfo:eu-repo/semantics/publishedVersion-
dc.identifier.idgrec73518cat
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess-
Appears in Collections:Articles publicats en revistes (Física Aplicada)

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