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| Issue Date | Title | Author(s) |
|---|---|---|
| 2-Aug-2016 | Quantitative parameters for the examination of InGaN QW multilayers by low-loss EELS | Eljarrat Ascunce, Alberto; López Conesa, Lluís; Magén, César; García-Lepetit, Noemí; Gacevic, Zarko; Calleja Pardo, Enrique; Peiró Martínez, Francisca; Estradé Albiol, Sònia |
| 18-Dec-2013 | Towards a new dimension in analytical TEM: EELS, Tomography and the Spectrum Volume | Yedra Cardona, Lluís |
| 28-Jun-2016 | In-situ isotopic analysis at nanoscale using parallel ion electron spectrometry: a powerful new paradigm for correlative microscopy | Yedra Cardona, Lluís; Eswara, Santhana; Dowsett, David; Wirtz, Tom |
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