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Issue DateTitleAuthor(s)
1997Caracterización estructural de capas epitaxiadas de InGaAs/InAlAs crecidas sobre substratos (111) de InPVilà i Arbonès, Anna Maria; Peiró Martínez, Francisca; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon
2-Aug-2016Quantitative parameters for the examination of InGaN QW multilayers by low-loss EELSEljarrat Ascunce, Alberto; López Conesa, Lluís; Magén, César; García-Lepetit, Noemí; Gacevic, Zarko; Calleja Pardo, Enrique; Peiró Martínez, Francisca; Estradé Albiol, Sònia