# name
In-situ isotopic analysis at nanoscale using parallel ion electron spectrometry: a powerful new paradigm for correlative microscopy

# metadata.dc.description.abstract[].value
Isotopic analysis is of paramount importance across the entire gamut of scientific research. To advance the frontiers of knowledge, a technique for nanoscale isotopic analysis is indispensable. Secondary Ion Mass Spectrometry (SIMS) is a well-established technique for analyzing isotopes, but its spatial-resolution is fundamentally limited. Transmission Electron Microscopy (TEM) is a well-known method for high-resolution imaging down to the atomic scale. However, isotopic analysis in TEM is not possible. Here, we introduce a powerful new paradigm for in-situ correlative microscopy called the Parallel Ion Electron Spectrometry by synergizing SIMS with TEM. We demonstrate this technique by distinguishing lithium carbonate nanoparticles according to the isotopic label of lithium, viz. 6Li and 7Li and imaging them at high-resolution by TEM, adding a new dimension to correlative microscopy.

# metadata.dc.rights[].value
cc-by (c) Yedra Cardona, Lluís et al., 2016

# metadata.dc.source[].value
Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)

# metadata.dc.subject.classification[].value
Espectroscòpia de pèrdua d'energia d'electrons

# metadata.dc.title[].value
In-situ isotopic analysis at nanoscale using parallel ion electron spectrometry: a powerful new paradigm for correlative microscopy