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Metal island film-based structures for sensing using spectrophotometry and ellipsometry

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Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements.

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Applied Physics A-Materials Science & Processing, 2014, vol. 115, num. 2, p. 481-486

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Articles publicats en revistes (Física Aplicada)

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Metal island film-based structures for sensing using spectrophotometry and ellipsometry