# name
Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization

# metadata.dc.description.abstract[].value
We present a procedure for the optical characterization of thin-film stacks from spectrophotometric data. The procedure overcomes the intrinsic limitations arising in the numerical determination of many
parameters from reflectance or transmittance spectra measurements. The key point is to use all the
information available from the manufacturing process in a single global optimization process. The method is illustrated by a case study of solgel applications.

# metadata.dc.source[].value
Articles publicats en revistes (Física Aplicada)

# metadata.dc.title[].value
Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization