# metadata.dc.description[].value
Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Any: 2014, Tutor: Oriol Arteaga

# metadata.dc.description.abstract[].value
We describe a microscope that can measure simultaneously all the Mueller matrix
elements of a sample with high spatial resolution. This measure is possible thanks to the dual
rotating compensator method, which analyses the variation in time of the intensity at every pixel
of the camera detector. This work reports the measurement principle, the instrumental details, the calibration, and some applications of the microscope.